Simple Dflip-flop Behavioral Model of ESD Immunity for use in the ISO 10605 Standard

Guangyao Shen*, V Khilkevich, S Yang, D Pommerenke, H Aichele, D Eichel, C Keller

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

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