Simultaneous extraction of charge density dependent mobility and variable contact resistance from thin film transistors

Riccardo Di Pietro, Deepak Venkateshvaran, Andreas Klug, Emil List-Kratochvil, Antonio Facchetti, Henning Sirringhaus, Dieter Neher

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)193501-1-193501-6
JournalApplied Physics Letters
Publication statusPublished - 2014

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this