SLIC EVM-Error vector magnitude without demodulation

Karl Freiberger, Harald Enzinger, Christian Vogel

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review


We present a method for measuring a communication signal's inband error caused by a non-ideal device under test (DUT). In contrast to the established error vector magnitude (EVM), we do not demodulate the data symbols. Rather, we subtract linearly correlated (SLIC) parts from the DUT output and analyze the power spectral density of the remaining error signal. Consequently, we do not require in-depth knowledge of the modulation standard. This makes our method well suited for measurements with cutting-edge communication signals, without the need to purchase or implement a dedicated EVM analyzer. We show that our SLIC-EVM approach allows for estimating the subcarrier-dependent EVM for typical transceiver impairments like IQ mismatch, phase noise, and power amplifier (PA) nonlinearity. We present measurement results of a WLAN PA, showing less than 0.2 dB absolute deviation from the regular EVM with demodulation.

Original languageEnglish
Title of host publication89th ARFTG Microwave Measurement Conference
Subtitle of host publicationAdvanced Technologies for Communications, ARFTG 2017
PublisherInstitute of Electrical and Electronics Engineers
ISBN (Electronic)9781538627471
Publication statusPublished - 3 Aug 2017
Event89th ARFTG Microwave Measurement Conference, ARFTG 2017 - Honolulu, United States
Duration: 9 Jun 2017 → …


Conference89th ARFTG Microwave Measurement Conference, ARFTG 2017
Country/TerritoryUnited States
Period9/06/17 → …


  • EPR
  • EVM
  • intermodulation distortion
  • nonlinearity
  • NPR
  • power amplifiers
  • wireless LAN

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Instrumentation

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