Abstract
Coupling or electromagnetic interference between different components of a complex electronic product is an important challenge for RF designers. Therefore, reconstruction of unknown fields, especially perpendicular to the scanning plane, is an important issue in the design procedure. A Method of Moment (MoM) based current reconstruction technique is used in this work to reconstruct fields in all planes, especially in perpendicular planes, using given scanning information. Two intended radiators (a bowtie and a ring antenna) and one unintended radiator are used to validate the method. To investigate this method's reaction to noise, all examples have been simulated in a 3D full-wave time domain solver, and white Gaussian noise (SNR =10 dB) is added in a post-processing step. It is shown that this method can accurately predict fields in the direction of given scanning information for any type of source. However, predicted fields in perpendicular planes are only valid for 2D source structures.
Original language | English |
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Title of host publication | 2019 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMC+SIPI 2019 |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 584-589 |
Number of pages | 6 |
ISBN (Electronic) | 9781538691991 |
DOIs | |
Publication status | Published - 1 Jul 2019 |
Externally published | Yes |
Event | 2019 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMC+SIPI 2019 - New Orleans, United States Duration: 22 Jul 2019 → 26 Jul 2019 |
Conference
Conference | 2019 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMC+SIPI 2019 |
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Country/Territory | United States |
City | New Orleans |
Period | 22/07/19 → 26/07/19 |
Keywords
- current reconstruction
- Inverse method of moment (MoM)
- least square method (LSQ)
ASJC Scopus subject areas
- Signal Processing
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering
- Safety, Risk, Reliability and Quality