Sources of analyte contamination and loss during the analytical process

Günter Knapp, Peter Schramel

Research output: Chapter in Book/Report/Conference proceedingChapter

Original languageEnglish
Title of host publicationSample preparation for trace element analysis
Place of PublicationAmsterdam
PublisherElsevier B.V.
Pages23-45
Volume41
Edition1
ISBN (Print)0-444-51101-6
Publication statusPublished - 2003

Publication series

NameWilson & Wilson's comprehensive analytical chemistry
PublisherElsevier Science B.V.

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