Abstract
Often, electromagnetic interference (EMI) scanning applications require phase and magnitude information for the creation of equivalent radiation models and far-field predictions. Magnitude information can be obtained using a spectrum analyzer (SA), which is relatively inexpensive compared to phase resolving instruments such as vector network analyzers (VNAs) and oscilloscopes at tens of GHz. This paper introduces and optimizes a cost-effective SA-based phase measurement method and compares the results to a VNA and oscilloscope-based methods for EMI signal sources. The measured-phase distribution obtained from the three different instruments is additionally compared with the simulated phase determined from full-wave simulation. The three measurement methods are compared based on the type of signal spectrum to be measured, such as single or multiple frequencies, signals requiring low-resolution bandwidth measurements, or transient signal events. The SA-based phase measurement technique is designed to operate from 5 to 12 GHz. However, the system frequency bandwidth is limited only by the frequency bandwidth of the individual RF components used in the SA measurement system
Original language | English |
---|---|
Article number | 8743430 |
Pages (from-to) | 848 - 858 |
Number of pages | 11 |
Journal | IEEE Transactions on Electromagnetic Compatibility |
Volume | 62 |
Issue number | 3 |
DOIs | |
Publication status | Published - Jun 2020 |
Externally published | Yes |
Keywords
- Electromagnetic interference (EMI)
- near-field measurements
- oscilloscope
- phase-resolved measurements
- probes
- spectrum analyzer (SA)
- vector network analyzer (VNA)
ASJC Scopus subject areas
- Condensed Matter Physics
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering