@inproceedings{38805b3b5fd7493fb2f8bfacedd31d50,
title = "Statistical Analysis of Semiconductor Images",
author = "Sarah Karasek and Herwig Friedl and Peter Scheibelhofer",
year = "2018",
language = "English",
volume = "1",
pages = "151--156",
booktitle = "Proceedings of the 33rd International Workshop on Statistical Modelling",
publisher = "University of Bristol",
address = "United Kingdom",
note = "33rd International Workshop on Statistical Modelling, IWSM 2018 ; Conference date: 15-07-2018 Through 20-07-2018",
}