Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM

Alfred Neuhold; Stefanie Fladischer; Stefan Mitsche; Nadezda Matsko; Heinz-Georg Flesch; Armin Moser; Detlef M. Smilgies; Elke Kraker; Werner Grogger; Roland Resel

Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM

Alfred Neuhold, Stefanie Fladischer, Stefan Mitsche, Nadezda Matsko, Heinz-Georg Flesch, Armin Moser, Detlef M. Smilgies, Elke Kraker, Werner Grogger, Roland Resel

Research output: Contribution to conference › Poster

Original language	English
Publication status	Published - 2010
Event	10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging - Warwick Duration: 20 Sept 2010 → 23 Sept 2010

Conference

Conference	10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging
City	Warwick
Period	20/09/10 → 23/09/10

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)
Application
Experimental

Cite this

Neuhold, A., Fladischer, S., Mitsche, S., Matsko, N., Flesch, H.-G., Moser, A., Smilgies, D. M., Kraker, E., Grogger, W., & Resel, R. (2010). Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM. Poster session presented at 10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging, Warwick.

Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM. / Neuhold, Alfred; Fladischer, Stefanie; Mitsche, Stefan et al.
2010. Poster session presented at 10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging, Warwick.

Research output: Contribution to conference › Poster

Neuhold, A, Fladischer, S, Mitsche, S, Matsko, N, Flesch, H-G, Moser, A, Smilgies, DM, Kraker, E, Grogger, W & Resel, R 2010, 'Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM', 10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging, Warwick, 20/09/10 - 23/09/10.

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title = "Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM",

author = "Alfred Neuhold and Stefanie Fladischer and Stefan Mitsche and Nadezda Matsko and Heinz-Georg Flesch and Armin Moser and Smilgies, {Detlef M.} and Elke Kraker and Werner Grogger and Roland Resel",

year = "2010",

language = "English",

note = "10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging ; Conference date: 20-09-2010 Through 23-09-2010",

}

TY - CONF

T1 - Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM

AU - Neuhold, Alfred

AU - Fladischer, Stefanie

AU - Mitsche, Stefan

AU - Matsko, Nadezda

AU - Flesch, Heinz-Georg

AU - Moser, Armin

AU - Smilgies, Detlef M.

AU - Kraker, Elke

AU - Grogger, Werner

AU - Resel, Roland

PY - 2010

Y1 - 2010

UR - http://www2.warwick.ac.uk/fac/sci/physics/research/condensedmatt/ferroelectrics/xtop2010

M3 - Poster

T2 - 10th Biennial Conference on High Resolution X-Ray Diffraction and Imaging

Y2 - 20 September 2010 through 23 September 2010

ER -

Structural and morphological characterization of an organic multilayer photodiode with X-ray scattering techniques, electron microscopy and AFM

Conference

Treatment code (Nähere Zuordnung)

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Cite this