Susceptibility Scanning applied as IC Qualification Tool for Avoiding System Level Immunity Problems

Giorgi Muchaidze, Jayong Koo, T. Li, Q. Cai, J. Min, Lijun Han, David Johannes Pommerenke

Research output: Contribution to conferencePaperpeer-review

Original languageEnglish
Publication statusPublished - 2007
Externally publishedYes
EventICONIC'2007: 3rd International Conference on Electromagnetic Near-Field Characterization and Imaging - St. Louis, United States
Duration: 27 Jun 200729 Jun 2007


Country/TerritoryUnited States
CitySt. Louis

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