@inproceedings{0fe4b614e4b341bea596f2d5c46b1c87,
title = "System-level design for ESD protection on multiple IO interfaces",
abstract = "This paper introduces the application of system-efficient ESD design (SEED) to ESD-induced pulses that are typical for system-level ESD. Emphasis is given to USB connectors because it has been shown that discharges to the connector shell will not lead to damaging current levels; however, the current levels are sufficient to cause soft-failures and possibly lead to latch-up of the USB IC.",
keywords = "Electrostatic discharge (ESD), snapback, SPICE modeling, system-efficient ESD design (SEED), transient voltage suppressor (TVS)",
author = "Pengyu Wei and Javad Meiguni and David Pommerenke",
year = "2018",
month = may,
day = "25",
doi = "10.1109/IRPS.2018.8353547",
language = "English",
series = "IEEE International Reliability Physics Symposium Proceedings",
publisher = "Institute of Electrical and Electronics Engineers",
pages = "2C.11--2C.18",
booktitle = "2018 IEEE International Reliability Physics Symposium, IRPS 2018",
address = "United States",
note = "2018 IEEE International Reliability Physics Symposium, IRPS 2018 ; Conference date: 11-03-2018 Through 15-03-2018",
}