TEM analysis of deformation induced dynamic nanocrystallization in an amorphous CoTi alloy

Stefan Noisternig; Christian Ebner; Christoph Gammer; Christian Rentenberger; Christian Gspan; Hans-Peter Karnthaler

doi:10.1002/9783527808465.EMC2016.5361

TEM analysis of deformation induced dynamic nanocrystallization in an amorphous CoTi alloy

Stefan Noisternig, Christian Ebner, Christoph Gammer, Christian Rentenberger, Christian Gspan, Hans-Peter Karnthaler

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper

Original language	English
Title of host publication	European Microscopy Congress 2016: Proceedings
Publisher	European Microscopy Society
Pages	67-68
ISBN (Electronic)	978-3-527-80846-5
DOIs	https://doi.org/10.1002/9783527808465.EMC2016.5361
Publication status	Published - 2017
Event	16th European Microscopy Conference: EMC 2016 - Lyon Convention Center, Lyon, France Duration: 28 Aug 2016 → 2 Sept 2016 Conference number: 16 http://www.emc2016.fr/en/

Conference

Conference	16th European Microscopy Conference
Abbreviated title	EMC 2016
Country/Territory	France
City	Lyon
Period	28/08/16 → 2/09/16
Internet address	http://www.emc2016.fr/en/

ASJC Scopus subject areas

Materials Science(all)

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Access to Document

10.1002/9783527808465.EMC2016.5361

Cite this

Noisternig, S, Ebner, C, Gammer, C, Rentenberger, C, Gspan, C & Karnthaler, H-P 2017, TEM analysis of deformation induced dynamic nanocrystallization in an amorphous CoTi alloy. in European Microscopy Congress 2016: Proceedings. European Microscopy Society, pp. 67-68, 16th European Microscopy Conference, Lyon, France, 28/08/16. https://doi.org/10.1002/9783527808465.EMC2016.5361

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author = "Stefan Noisternig and Christian Ebner and Christoph Gammer and Christian Rentenberger and Christian Gspan and Hans-Peter Karnthaler",

year = "2017",

doi = "10.1002/9783527808465.EMC2016.5361",

language = "English",

pages = "67--68",

booktitle = "European Microscopy Congress 2016: Proceedings",

publisher = "European Microscopy Society",

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AU - Noisternig, Stefan

AU - Ebner, Christian

AU - Gammer, Christoph

AU - Rentenberger, Christian

AU - Gspan, Christian

AU - Karnthaler, Hans-Peter

N1 - Conference code: 16

PY - 2017

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DO - 10.1002/9783527808465.EMC2016.5361

M3 - Conference paper

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EP - 68

BT - European Microscopy Congress 2016: Proceedings

PB - European Microscopy Society

T2 - 16th European Microscopy Conference

Y2 - 28 August 2016 through 2 September 2016

ER -