TEM-Cell and Surface Scan to Identify the Electromagnetic Emission of Integrated Circuits

Timm Ostermann, Bernd Deutschmann

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Original languageEnglish
Title of host publicationVLSI in the nanometer era
Place of PublicationNew York, NY
PublisherAssociation of Computing Machinery
ISBN (Print)1-58113-677-3
Publication statusPublished - 2003
EventACM Great Lakes Symposium on VLSI - Washington, D.C., United States
Duration: 28 Apr 200329 Apr 2003


ConferenceACM Great Lakes Symposium on VLSI
Country/TerritoryUnited States
CityWashington, D.C.

Fields of Expertise

  • Sonstiges

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