TEM Characterization of Optoelectronic Devices Based on Conjugated Polymers: Can FIB Specimen Preparation Help?

Research output: Contribution to conference › (Old data) Lecture or Presentation

Original language	English
Publication status	Published - 3 Sept 2006
Event	The 16th International Microscopy Congress - Sapporo, Japan Duration: 3 Sept 2006 → 8 Sept 2006

Conference	The 16th International Microscopy Congress
Country/Territory	Japan
City	Sapporo
Period	3/09/06 → 8/09/06

Fields of Expertise

@conference{dcc0cb75ec02499ba1020a1270c6813d,

title = "TEM Characterization of Optoelectronic Devices Based on Conjugated Polymers: Can FIB Specimen Preparation Help?",

author = "Elena Tchernychova and Werner Grogger and Meltem Sezen and Peter P{\"o}lt and Evelin Fisslthaler and Emil List and Ferdinand Hofer",

year = "2006",

month = sep,

day = "3",

language = "English",

note = "The 16th International Microscopy Congress ; Conference date: 03-09-2006 Through 08-09-2006",