Temperature dependent bais-stress measurement in organic thin film transistors

Thomas Obermüller, Marco Marchl, Simon Josef Außerlechner, Andrej Golubkov, Anja Haase, Barbara Stadlober, Lucas Hauser, Gregor Trimmel, Matthias Edler, Thomas Grießer, Wolfgang Kern, Egbert Zojer

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - 2009
EventInternational Conference on Organic Electronics 2009 - University of Liverpool, Liverpool, UK
Duration: 15 Jun 200917 Jun 2009

Conference

ConferenceInternational Conference on Organic Electronics 2009
CityUniversity of Liverpool, Liverpool, UK
Period15/06/0917/06/09

Treatment code (Nähere Zuordnung)

  • Application
  • Experimental

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