The interior interfaces of a semiconductor/metal nanocomposite and their influence on its physical properties

Petra Granitzer; Klemens Rumpf; Peter Pölt; Mihaela Albu; Boril Stefanov Chernev

doi:10.1002/pssc.200881730

The interior interfaces of a semiconductor/metal nanocomposite and their influence on its physical properties

Petra Granitzer, Klemens Rumpf, Peter Pölt, Mihaela Albu, Boril Stefanov Chernev

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	2222-2227
Journal	Physica Status Solidi (C) - Current Topics in Solid State Physics
Volume	6
Issue number	10
DOIs	https://doi.org/10.1002/pssc.200881730
Publication status	Published - 2009

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

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10.1002/pssc.200881730

Microanalysis and in-situ studies using scanning electron microscopy
1/01/01 → 14/05/20
Project: Research area

Cite this

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title = "The interior interfaces of a semiconductor/metal nanocomposite and their influence on its physical properties",

author = "Petra Granitzer and Klemens Rumpf and Peter P{\"o}lt and Mihaela Albu and Chernev, {Boril Stefanov}",

year = "2009",

doi = "10.1002/pssc.200881730",

language = "English",

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journal = "Physica Status Solidi (C) - Current Topics in Solid State Physics",

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T1 - The interior interfaces of a semiconductor/metal nanocomposite and their influence on its physical properties

AU - Granitzer, Petra

AU - Rumpf, Klemens

AU - Pölt, Peter

AU - Albu, Mihaela

AU - Chernev, Boril Stefanov

PY - 2009

Y1 - 2009

U2 - 10.1002/pssc.200881730

DO - 10.1002/pssc.200881730

M3 - Article

SN - 1610-1642

VL - 6

SP - 2222

EP - 2227

JO - Physica Status Solidi (C) - Current Topics in Solid State Physics

JF - Physica Status Solidi (C) - Current Topics in Solid State Physics

IS - 10

ER -

The interior interfaces of a semiconductor/metal nanocomposite and their influence on its physical properties

Treatment code (Nähere Zuordnung)

Access to Document

Projects

Microanalysis and in-situ studies using scanning electron microscopy

Cite this