The Performance of EDXS at Elevated Sample Temperatures Using a MEMS-Based In Situ TEM Heating System

Robert Krisper*, Judith Lammer, Yevheniy Pivak, Evelin Fisslthaler, Werner Grogger

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


Since the development of MEMS heating holders, dynamic in-situ experiments at elevated temperatures may be complemented by X-ray spectrometry for chemical analysis. Although the amount of IR radiation is small when compared to furnace holders, the influence of IR radiation emitted from the heating device on the quality of the X-ray spectra is significant. In this work, we systematically examine the influence of infrared (IR) radiation generated by MEMS-based in situ heating systems (DENSsolutions single- and double-tilt holders) on the results and interpretation of energy-dispersive X-ray (EDX) spectra through simulation and measurement. Focal points of interest in this study are the influence of holder geometry, shadowing and orientation with respect to the different emission characteristics of IR and X-ray photons and their interaction with a side-entry and a multi-detector system. IR photons substantially contribute to count rates, dead time, electronic noise levels, energy resolution, and detection efficiency of semiconductor detectors. At higher sample temperatures, they ultimately limit the feasibility of EDXS for elemental characterization and especially the traceability of low-Z elements. This work provides a quantitative insight into the influence of all relevant parameters related to in situ heating experiments on the spectral quality. Bearing this in mind, we aim to provide a guide to optimizing in situ heating experiments with respect to chemical EDXS analysis.

Original languageEnglish
Article number113461
Publication statusPublished - Apr 2022


  • detector shadowing
  • EDXS
  • energy resolution
  • in situ heating
  • in situ TEM
  • solid angle

ASJC Scopus subject areas

  • General Materials Science
  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)


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