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Abstract
We have developed a MiAMoRE test chip in a 0.18 µm CMOS process, containing a selection of devices typically used in analog integrated circuit design: MOS transistors of different types and polarities, bipolar transistors, resistors, capacitors, diodes and field oxide transistors. Many of these devices were designed with non-standard layouts with the objective to improve the performance against TID effects. In total there are over a hundred devices, therefore their full characterization was the primary challenge in the test concept. The test chip has been exposed at two different sources: low and medium energy X-rays including characterization at different dose steps. After showing the test results of selected devices we discuss the details on TID calculation and reporting, in the attempt to make a correct comparison of the results from two different facilities.
Original language | English |
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Publication status | Published - 2017 |
Event | The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications - Leibniz Rechenzentrum, Garching, Germany Duration: 23 Oct 2017 → 26 Oct 2017 Conference number: 13 https://seressa.in.tum.de/ |
Workshop
Workshop | The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications |
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Abbreviated title | SERESSA 2017 |
Country/Territory | Germany |
City | Garching |
Period | 23/10/17 → 26/10/17 |
Internet address |
Keywords
- Total Ionizing Dose
- X-ray
- Integrated circuits
Fields of Expertise
- Information, Communication & Computing
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Dive into the research topics of 'TID characterization at low and medium energy X-rays of 0.18 µm analog integrated test chip MiAMoRE'. Together they form a unique fingerprint.Activities
- 1 Poster presentation
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TID characterization at low and medium energy X-rays of 0.18 µm analog integrated test chip MiAMoRE
Varvara Bezhenova (Speaker) & Alicja Malgorzata Michalowska-Forsyth (Speaker)
23 Oct 2017 → 26 Oct 2017Activity: Talk or presentation › Poster presentation › Science to science