Abstract
In situ and time-resolved simultaneous analysis by two different and complementary techniques, Fourier transform infrared spectroscopy (FTIR) and small-angle X-ray scattering (SAXS), has been developed. A conventional source for the infrared light and synchrotron radiation for the X-ray beam have been used. The new technique has been applied to the study of self-assembling mesostructured films during dip-coating. The combined FTIR and SAXS analytical approach has given the possibility of getting a direct correlation between the chemical processes and the structural changes occurring in the film during the deposition.
Original language | English |
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Pages (from-to) | 5345-5350 |
Number of pages | 6 |
Journal | The Journal of Physical Chemistry C |
Volume | 111 |
Issue number | 14 |
DOIs | |
Publication status | Published - 12 Apr 2007 |
Externally published | Yes |
ASJC Scopus subject areas
- Physical and Theoretical Chemistry
- Energy(all)
- Electronic, Optical and Magnetic Materials
- Surfaces, Coatings and Films