TY - GEN
T1 - Total Deep Variation for Noisy Exit Wave Reconstruction in Transmission Electron Microscopy
AU - Pinetz, Thomas
AU - Kobler, Erich
AU - Doberstein, Christian
AU - Berkels, Benjamin
AU - Effland, Alexander
N1 - Publisher Copyright:
© 2021, Springer Nature Switzerland AG.
PY - 2021
Y1 - 2021
N2 - Transmission electron microscopes (TEMs) are ubiquitous devices for high-resolution imaging on an atomic level. A key problem related to TEMs is the reconstruction of the exit wave, which is the electron signal at the exit plane of the examined specimen. Frequently, this reconstruction is cast as an ill-posed nonlinear inverse problem. In this work, we integrate the data-driven total deep variation regularizer to reconstruct the exit wave in this inverse problem. In several numerical experiments, the applicability of the proposed method is demonstrated for different materials.
AB - Transmission electron microscopes (TEMs) are ubiquitous devices for high-resolution imaging on an atomic level. A key problem related to TEMs is the reconstruction of the exit wave, which is the electron signal at the exit plane of the examined specimen. Frequently, this reconstruction is cast as an ill-posed nonlinear inverse problem. In this work, we integrate the data-driven total deep variation regularizer to reconstruct the exit wave in this inverse problem. In several numerical experiments, the applicability of the proposed method is demonstrated for different materials.
KW - Deep learning
KW - Exit wave reconstruction
KW - Nonlinear inverse problem
KW - Total deep variation
KW - Transmission electron microscopy
UR - http://www.scopus.com/inward/record.url?scp=85106439190&partnerID=8YFLogxK
U2 - 10.1007/978-3-030-75549-2_39
DO - 10.1007/978-3-030-75549-2_39
M3 - Conference paper
AN - SCOPUS:85106439190
SN - 9783030755485
T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
SP - 491
EP - 502
BT - Scale Space and Variational Methods in Computer Vision - 8th International Conference, SSVM 2021, Proceedings
A2 - Elmoataz, Abderrahim
A2 - Fadili, Jalal
A2 - Quéau, Yvain
A2 - Rabin, Julien
A2 - Simon, Loïc
PB - Springer Science and Business Media Deutschland GmbH
T2 - 8th International Conference on Scale Space and Variational Methods in Computer Vision, SSVM 2021
Y2 - 16 May 2021 through 20 May 2021
ER -