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Abstract
Abstract:
Total ionizing dose effects on transistors, fabricated in 0.18 μm CMOS technology are investigated. Radiation induced changes in NMOS and PMOS transistors parameters are discussed. Radiation induced narrow channel effect (RINCE) is demonstrated. Degree of influence of the bias conditions on the radiation response of the transistors in the given CMOS process is shown. Finally, impact of the devices electrical characteristics change on radiation hard design as well as outlook of further investigation activities is discussed.
Total ionizing dose effects on transistors, fabricated in 0.18 μm CMOS technology are investigated. Radiation induced changes in NMOS and PMOS transistors parameters are discussed. Radiation induced narrow channel effect (RINCE) is demonstrated. Degree of influence of the bias conditions on the radiation response of the transistors in the given CMOS process is shown. Finally, impact of the devices electrical characteristics change on radiation hard design as well as outlook of further investigation activities is discussed.
Original language | English |
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Pages | 366-369 |
Number of pages | 4 |
Publication status | Published - 28 Jul 2016 |
Event | Asia-Pacific International Symposium on Electromagnetic Compatibility & Signal Integrity (APEMC) - Shenzhen, China Duration: 18 May 2016 → 21 May 2016 |
Conference
Conference | Asia-Pacific International Symposium on Electromagnetic Compatibility & Signal Integrity (APEMC) |
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Country/Territory | China |
City | Shenzhen |
Period | 18/05/16 → 21/05/16 |
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Total ionizing dose effects on MOS transistors fabricated in 0.18 µm CMOS technology
Varvara Bezhenova (Speaker)
18 May 2016 → 21 May 2016Activity: Talk or presentation › Poster presentation › Science to science