Total scattering cross section of N2 and effective beam gas path length measurements in a low vacuum scanning electron microscope.

Research output: Contribution to conference › Poster

Original language	English
Publication status	Published - 2008
Event	MicroScience - London, United Kingdom Duration: 23 Jun 2008 → 27 Jun 2008

Treatment code (Nähere Zuordnung)

@conference{a8225d41b7f64b1f84cd02c3b2f7dd35,

title = "Total scattering cross section of N2 and effective beam gas path length measurements in a low vacuum scanning electron microscope.",

author = "Johannes Rattenberger and Julian Wagner and Hartmuth Schr{\"o}ttner and Stefan Mitsche and Bernhard Schaffer and Armin Zankel",

year = "2008",

language = "English",

note = "MicroScience ; Conference date: 23-06-2008 Through 27-06-2008",

}

TY - CONF

T1 - Total scattering cross section of N2 and effective beam gas path length measurements in a low vacuum scanning electron microscope.

AU - Rattenberger, Johannes

AU - Wagner, Julian

AU - Schröttner, Hartmuth

AU - Mitsche, Stefan

AU - Schaffer, Bernhard

AU - Zankel, Armin

PY - 2008

Y1 - 2008

M3 - Poster

T2 - MicroScience

Y2 - 23 June 2008 through 27 June 2008

ER -