TVS devices transient behavior modeling framework and application to Seed

Li Shen, Shubhankar Marathe, Javad Meiguni, Guangxiao Luo, Jianchi Zhou, David Pommerenke

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review


The transient behavior for four different types of TVS (non-snapback, snapback, spark gap, varistor) is modeled using the same modeling framework. By a 10 ns VF-TLP, the quasi-static I-V curve and the transient turn-on are captured and modeled in ADS. The models are applied in a SEED simulation to investigate the strengths and weaknesses of the modeling frame.

Original languageEnglish
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings 2019, EOS/ESD 2019
PublisherESD Association
ISBN (Electronic)9781585373116
Publication statusPublished - 1 Sept 2019
Externally publishedYes
Event41st Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2019 - Riverside, United States
Duration: 15 Sept 201920 Sept 2019

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
ISSN (Print)0739-5159


Conference41st Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2019
Country/TerritoryUnited States

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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