Understanding surface enhanced Raman spectroscopy using accurate simulations of electric nearfields

Research output: Chapter in Book/Report/Conference proceedingConference paper

Original languageEnglish
Title of host publicationASEM
Pages45
Publication statusPublished - 2017
Event7th ASEM-Workshop Advanced Electron Microscopy - TU Wien, Wien, Austria
Duration: 20 Apr 201721 Apr 2017

Conference

Conference7th ASEM-Workshop Advanced Electron Microscopy
Country/TerritoryAustria
CityWien
Period20/04/1721/04/17

ASJC Scopus subject areas

  • Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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