Universal scaling of surface plasmon modes

Franz Schmidt; Harald Ditlbacher; Andreas Hohenau; Ulrich Hohenester; Ferdinand Hofer; Joachim R. Krenn

Universal scaling of surface plasmon modes

Franz Schmidt, Harald Ditlbacher, Andreas Hohenau, Ulrich Hohenester, Ferdinand Hofer, Joachim R. Krenn

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Abstractbook M&M 2014
Publisher	.
Pages	xx-xx
Publication status	Published - 2014
Event	Microscopy and Microanalysis 2014 - Hartford, USA Duration: 3 Aug 2014 → 7 Aug 2014

Conference

Conference	Microscopy and Microanalysis 2014
City	Hartford, USA
Period	3/08/14 → 7/08/14

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

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MM2014_abstract_fpschmidt.pdfFinal published version, 369 KB

Cite this

@inproceedings{289f9911499c4784b44fde10fa17e31c,

title = "Universal scaling of surface plasmon modes",

author = "Franz Schmidt and Harald Ditlbacher and Andreas Hohenau and Ulrich Hohenester and Ferdinand Hofer and Krenn, {Joachim R.}",

year = "2014",

language = "English",

pages = "xx--xx",

booktitle = "Abstractbook M&M 2014",

publisher = ".",

note = "Microscopy and Microanalysis 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

}

TY - GEN

T1 - Universal scaling of surface plasmon modes

AU - Schmidt, Franz

AU - Ditlbacher, Harald

AU - Hohenau, Andreas

AU - Hohenester, Ulrich

AU - Hofer, Ferdinand

AU - Krenn, Joachim R.

PY - 2014

Y1 - 2014

UR - http://microscopy.org/MandM/2014/

M3 - Conference paper

SP - xx-xx

BT - Abstractbook M&M 2014

PB - .

T2 - Microscopy and Microanalysis 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Universal scaling of surface plasmon modes

Conference

Fields of Expertise

Treatment code (Nähere Zuordnung)

Access to Document

Other files and links

Cite this