Using Device Simulations to Optimize ESD Protection Circuits

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	International Symposium on Electromagnetic Compatibility
Publisher	.
Pages	963-968
ISBN (Print)	0-7803-8443-1
DOIs	https://doi.org/10.1109/ISEMC.2004.1349956
Publication status	Published - 2004
Event	2004 IEEE International Symposium on Electromagnetic Compatibility: EMC 2004 - Santa Clara, United States Duration: 9 Aug 2004 → 13 Aug 2004

Conference	2004 IEEE International Symposium on Electromagnetic Compatibility
Country/Territory	United States
City	Santa Clara
Period	9/08/04 → 13/08/04

Fields of Expertise

@inproceedings{0bcc9681ad7243c681007dac0a848ccd,

title = "Using Device Simulations to Optimize ESD Protection Circuits",

author = "B. Fankhauser and Bernd Deutschmann",

year = "2004",

doi = "10.1109/ISEMC.2004.1349956",

language = "English",

isbn = "0-7803-8443-1",

pages = "963--968",

booktitle = "International Symposium on Electromagnetic Compatibility",

publisher = ".",

note = "2004 IEEE International Symposium on Electromagnetic Compatibility : EMC 2004 ; Conference date: 09-08-2004 Through 13-08-2004",

}

TY - GEN

T1 - Using Device Simulations to Optimize ESD Protection Circuits

AU - Fankhauser, B.

AU - Deutschmann, Bernd

PY - 2004

Y1 - 2004

U2 - 10.1109/ISEMC.2004.1349956

DO - 10.1109/ISEMC.2004.1349956

M3 - Conference paper

SN - 0-7803-8443-1

SP - 963

EP - 968

BT - International Symposium on Electromagnetic Compatibility

PB - .

T2 - 2004 IEEE International Symposium on Electromagnetic Compatibility

Y2 - 9 August 2004 through 13 August 2004

ER -