Abstract
With the increasing complexity of electronic systems and their miniaturization, Electromagnetic Compatibility (EMC) concerns have increased due to the higher switching frequencies of buck/boost power converters. Electromagnetic Interference filters are used to comply with EMC limits. However, the optimal to-the-limit design of such a power system is difficult due to the large number of involved parameters which, in case of complex EMC simulation models, lead to prohibitively long simulation times. This paper develops a method based on wide-band surrogate models of a half bridge buck converter and its EMI filter, which is fast enough to allow 10,000 system evaluations in 4 minutes with an octa-core laptop. With the surrogate models, we demonstrate the feasibility of Multi-Objective Optimization (MOO) for minimizing common-mode emission and the size of the filter's common-mode choke. A computational advantage over LTspice simulations of at least 400 times has been achieved.
Original language | English |
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Title of host publication | 2023 Joint Asia-Pacific International Symposium on Electromagnetic Compatibility and International Conference on ElectroMagnetic Interference and Compatibility, APEMC/INCEMIC 2023 |
Publisher | Institute of Electrical and Electronics Engineers |
ISBN (Electronic) | 9798350338348 |
DOIs | |
Publication status | Published - 2023 |
Event | 2023 Joint Asia-Pacific International Symposium on Electromagnetic Compatibility and International Conference on ElectroMagnetic Interference and Compatibility: APEMC/INCEMIC 2023 - Bengaluru, India Duration: 22 May 2023 → 25 May 2023 |
Conference
Conference | 2023 Joint Asia-Pacific International Symposium on Electromagnetic Compatibility and International Conference on ElectroMagnetic Interference and Compatibility |
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Abbreviated title | APEMC/INCEMIC 2023 |
Country/Territory | India |
City | Bengaluru |
Period | 22/05/23 → 25/05/23 |
Keywords
- Conducted Emissions
- EMI Filter
- Kriging
- Power Electronics
- Surrogate Modeling
ASJC Scopus subject areas
- Computer Networks and Communications
- Electrical and Electronic Engineering
- Safety, Risk, Reliability and Quality
- Electronic, Optical and Magnetic Materials
- Instrumentation
- Radiation