X-ray based tools for the investigation of buried interfaces in organic electronic devices

Alfred Neuhold; Hannes Brandner; Simon Außerlechner; Stefan Lorbek; Markus Neuschitzer; Egbert Zojer; Christian Teichert; Roland Resel

doi:10.1016/j.orgel.2012.11.016

X-ray based tools for the investigation of buried interfaces in organic electronic devices

Alfred Neuhold, Hannes Brandner, Simon Außerlechner, Stefan Lorbek, Markus Neuschitzer, Egbert Zojer, Christian Teichert, Roland Resel

Institute of Solid State Physics (5130)

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	479-487
Journal	Organic Electronics
Volume	14
DOIs	https://doi.org/10.1016/j.orgel.2012.11.016
Publication status	Published - 2013

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Access to Document

10.1016/j.orgel.2012.11.016

Cite this

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title = "X-ray based tools for the investigation of buried interfaces in organic electronic devices",

author = "Alfred Neuhold and Hannes Brandner and Simon Au{\ss}erlechner and Stefan Lorbek and Markus Neuschitzer and Egbert Zojer and Christian Teichert and Roland Resel",

year = "2013",

doi = "10.1016/j.orgel.2012.11.016",

language = "English",

volume = "14",

pages = "479--487",

journal = "Organic Electronics",

issn = "1566-1199",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - X-ray based tools for the investigation of buried interfaces in organic electronic devices

AU - Neuhold, Alfred

AU - Brandner, Hannes

AU - Außerlechner, Simon

AU - Lorbek, Stefan

AU - Neuschitzer, Markus

AU - Zojer, Egbert

AU - Teichert, Christian

AU - Resel, Roland

PY - 2013

Y1 - 2013

U2 - 10.1016/j.orgel.2012.11.016

DO - 10.1016/j.orgel.2012.11.016

M3 - Article

VL - 14

SP - 479

EP - 487

JO - Organic Electronics

JF - Organic Electronics

SN - 1566-1199

ER -