X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments

Alfred Neuhold, Jiri Novak, Heinz-Georg Flesch, Armin Moser, Tatjana Djuric, Souren Grigorian, Linda Grodd, Ulrich Pietsch, Roland Resel

Research output: Contribution to conferencePoster

Original languageGerman
Publication statusPublished - 2011
EventEuropean Materials Research Society Spring Meeting 2011: E-MRS Spring Meeting 2011 - Nizza, France
Duration: 9 May 201113 May 2011


ConferenceEuropean Materials Research Society Spring Meeting 2011
Abbreviated titleEMRS Spring Meeting 2011
OtherE-MRS Spring & Bilateral Meeting

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Application
  • Experimental

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