Accelerated Markov chain Monte Carlo sampling in electrical capacitance tomography

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Originalsprache	englisch
Seiten (von - bis)	1842-1854
Fachzeitschrift	COMPEL - The International Journal for Computation and Mathematics in Electrical and Electronic Engineering
DOIs	https://doi.org/10.1108/03321641111168147
Publikationsstatus	Veröffentlicht - 2011

Fields of Expertise

@article{848ce18f31fb4c049e5275e1639646a3,

title = "Accelerated Markov chain Monte Carlo sampling in electrical capacitance tomography",

author = "Daniel Watzenig and Markus Neumayer and Colin Fox",

year = "2011",

doi = "10.1108/03321641111168147",

language = "English",

pages = "1842--1854",

journal = "COMPEL - The International Journal for Computation and Mathematics in Electrical and Electronic Engineering",

issn = "2054-5606",

publisher = "Emerald Group Publishing Ltd.",

}

TY - JOUR

T1 - Accelerated Markov chain Monte Carlo sampling in electrical capacitance tomography

AU - Watzenig, Daniel

AU - Neumayer, Markus

AU - Fox, Colin

PY - 2011

Y1 - 2011

U2 - 10.1108/03321641111168147

DO - 10.1108/03321641111168147

M3 - Article

SN - 2054-5606

SP - 1842

EP - 1854

JO - COMPEL - The International Journal for Computation and Mathematics in Electrical and Electronic Engineering

JF - COMPEL - The International Journal for Computation and Mathematics in Electrical and Electronic Engineering

ER -