Characterization of the influence of different power supply styles on the electromagnetic emission of ICs by using the TEM-Cell method (IEC 61967-2)

Timm Ostermann; D. Schneider; C. Bacher; Bernd Deutschmann; R. Jungreithmair; W. Gut; C. Lackner; R. Koessl; R. Hagelauer

Characterization of the influence of different power supply styles on the electromagnetic emission of ICs by using the TEM-Cell method (IEC 61967-2)

Timm Ostermann, D. Schneider, C. Bacher, Bernd Deutschmann, R. Jungreithmair, W. Gut, C. Lackner, R. Koessl, R. Hagelauer

Institut für Elektronik (4390)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	International Workshop on Electromagnetic Compatibility of Integrated Circuits
Herausgeber (Verlag)	.
Seiten	57-60
Publikationsstatus	Veröffentlicht - 2002

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Dieses zitieren

Ostermann, T., Schneider, D., Bacher, C., Deutschmann, B., Jungreithmair, R., Gut, W., Lackner, C., Koessl, R., & Hagelauer, R. (2002). Characterization of the influence of different power supply styles on the electromagnetic emission of ICs by using the TEM-Cell method (IEC 61967-2). in International Workshop on Electromagnetic Compatibility of Integrated Circuits (S. 57-60). ..

Characterization of the influence of different power supply styles on the electromagnetic emission of ICs by using the TEM-Cell method (IEC 61967-2). / Ostermann, Timm; Schneider, D.; Bacher, C. et al.
International Workshop on Electromagnetic Compatibility of Integrated Circuits. ., 2002. S. 57-60.

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

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AU - Ostermann, Timm

AU - Schneider, D.

AU - Bacher, C.

AU - Deutschmann, Bernd

AU - Jungreithmair, R.

AU - Gut, W.

AU - Lackner, C.

AU - Koessl, R.

AU - Hagelauer, R.

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BT - International Workshop on Electromagnetic Compatibility of Integrated Circuits

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