Combined EDS and WDS analysis of thin specimens with high spatial and energy resolution in the scanning electron microscope

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	Microscopy for Global Challenges
Herausgeber (Verlag)	.
Seiten	IT-4-P3166
Publikationsstatus	Veröffentlicht - 2014
Veranstaltung	International Microscopy Congress 2014 - Prag Tschechische Republik Dauer: 7 Sept. 2014 → 12 Sept. 2014

Konferenz	International Microscopy Congress 2014
Ort	Prag Tschechische Republik
Zeitraum	7/09/14 → 12/09/14

Fields of Expertise

@inproceedings{ee5fc537c2884cbd8b54bef10c728071,

title = "Combined EDS and WDS analysis of thin specimens with high spatial and energy resolution in the scanning electron microscope",

author = "Stefan Mitsche and Peter P{\"o}lt",

year = "2014",

language = "English",

pages = "IT--4--P3166",

booktitle = "Microscopy for Global Challenges",

publisher = ".",

note = "International Microscopy Congress 2014 ; Conference date: 07-09-2014 Through 12-09-2014",

}

TY - GEN

T1 - Combined EDS and WDS analysis of thin specimens with high spatial and energy resolution in the scanning electron microscope

AU - Mitsche, Stefan

AU - Pölt, Peter

PY - 2014

Y1 - 2014

M3 - Conference paper

SP - IT-4-P3166

BT - Microscopy for Global Challenges

PB - .

T2 - International Microscopy Congress 2014

Y2 - 7 September 2014 through 12 September 2014

ER -