Direct Power Injection (DPI) to Measure the Immunity of Integrated Circuits Against Conducted Disturbances

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	International Mixed-Signal Testing Workshop
Herausgeber (Verlag)	.
Seiten	264-267
Publikationsstatus	Veröffentlicht - 2003
Veranstaltung	International Mixed-Signal Testing Workshop - Seville, Spanien Dauer: 25 Juni 2003 → 27 Juni 2003

Konferenz	International Mixed-Signal Testing Workshop
Land/Gebiet	Spanien
Ort	Seville
Zeitraum	25/06/03 → 27/06/03

Fields of Expertise

@inproceedings{70869cf10a314355b0d1a3f8348148f3,

title = "Direct Power Injection (DPI) to Measure the Immunity of Integrated Circuits Against Conducted Disturbances",

author = "Bernd Deutschmann and Timm Ostermann",

year = "2003",

language = "English",

pages = "264--267",

booktitle = "International Mixed-Signal Testing Workshop",

publisher = ".",

note = "International Mixed-Signal Testing Workshop ; Conference date: 25-06-2003 Through 27-06-2003",

}

TY - GEN

T1 - Direct Power Injection (DPI) to Measure the Immunity of Integrated Circuits Against Conducted Disturbances

AU - Deutschmann, Bernd

AU - Ostermann, Timm

PY - 2003

Y1 - 2003

M3 - Conference paper

SP - 264

EP - 267

BT - International Mixed-Signal Testing Workshop

PB - .

T2 - International Mixed-Signal Testing Workshop

Y2 - 25 June 2003 through 27 June 2003

ER -