Efficient Mutation Killers in Action

Bernhard Aichernig; Harald Brandl; Elisabeth Jöbstl; Willibald Krenn

Efficient Mutation Killers in Action

Bernhard Aichernig, Harald Brandl, Elisabeth Jöbstl, Willibald Krenn

Institut für Softwaretechnologie (7160)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	2011 Fourth International Conference on Software Testing, Verification and Validation (ICST 2011)
Herausgeber (Verlag)	Institute of Electrical and Electronics Engineers
Seiten	120-129
Publikationsstatus	Veröffentlicht - 2011
Veranstaltung	Fourth IEEE International Conference on Software Testing, Verification and Validation: ICST 2011 - Berlin, Deutschland Dauer: 21 März 2011 → 25 März 2011

Konferenz

Konferenz	Fourth IEEE International Conference on Software Testing, Verification and Validation
Land/Gebiet	Deutschland
Ort	Berlin
Zeitraum	21/03/11 → 25/03/11

Fields of Expertise

Information, Communication & Computing

EU-MOGENTES - Model-based Generation of Tests for Dependable Embedded Systems
Brandl, H., Krenn, W. K. & Aichernig, B.
1/01/08 → 31/12/10
Projekt: Foschungsprojekt

Dieses zitieren

Efficient Mutation Killers in Action. / Aichernig, Bernhard; Brandl, Harald; Jöbstl, Elisabeth et al.

2011 Fourth International Conference on Software Testing, Verification and Validation (ICST 2011). Institute of Electrical and Electronics Engineers, 2011. S. 120-129.

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Aichernig, B, Brandl, H, Jöbstl, E & Krenn, W 2011, Efficient Mutation Killers in Action. in 2011 Fourth International Conference on Software Testing, Verification and Validation (ICST 2011). Institute of Electrical and Electronics Engineers, S. 120-129, Fourth IEEE International Conference on Software Testing, Verification and Validation, Berlin, Deutschland, 21/03/11.

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title = "Efficient Mutation Killers in Action",

author = "Bernhard Aichernig and Harald Brandl and Elisabeth J{\"o}bstl and Willibald Krenn",

year = "2011",

language = "English",

pages = "120--129",

booktitle = "2011 Fourth International Conference on Software Testing, Verification and Validation (ICST 2011)",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "Fourth International Conference on Software Testing, Verification and Validation : ICST 2011 ; Conference date: 21-03-2011 Through 25-03-2011",

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TY - GEN

T1 - Efficient Mutation Killers in Action

AU - Aichernig, Bernhard

AU - Brandl, Harald

AU - Jöbstl, Elisabeth

AU - Krenn, Willibald

PY - 2011

Y1 - 2011

M3 - Conference paper

SP - 120

EP - 129

BT - 2011 Fourth International Conference on Software Testing, Verification and Validation (ICST 2011)

PB - Institute of Electrical and Electronics Engineers

T2 - Fourth International Conference on Software Testing, Verification and Validation

Y2 - 21 March 2011 through 25 March 2011

ER -

Efficient Mutation Killers in Action

Konferenz

Fields of Expertise

Projekte

EU-MOGENTES - Model-based Generation of Tests for Dependable Embedded Systems

Dieses zitieren