Electrochemical current-sensing atomic force microscopy in conductive solutions

Ilya Pobelov, Miklos Mohos, Koji Yoshida, Viliam Kolivoska, Amra Avdic, Alois Lugstein, Emmerich Bertagnolli, Kelly Leonhardt, Guy Denuault, Bernhard Gollas, Thomas Wandlowski

Publikation: Beitrag in einer FachzeitschriftArtikelBegutachtung

Abstract

Insulated atomic force microscopy probes carrying gold conductive tips were fabricated and employed as bifunctional force and current sensors in electrolyte solutions under electrochemical potential control. The application of the probes for current-sensing imaging, force and current–distance spectroscopy as well as scanning electrochemical microscopy experiments was demonstrated.
Originalspracheenglisch
Seiten (von - bis)115501-115510
FachzeitschriftNanotechnology
Jahrgang24
DOIs
PublikationsstatusVeröffentlicht - 2013

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Application
  • Experimental

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