Electron microprobe analysis of(1-x)BNT-xBKT

Michael Naderer; Klaus Reichmann; Denis Schütz; Florian Mittermayr

Electron microprobe analysis of(1-x)BNT-xBKT

Michael Naderer, Klaus Reichmann, Denis Schütz, Florian Mittermayr

Publikation: Konferenzbeitrag › (Altdaten) Vortrag oder Präsentation

Originalsprache	englisch
Publikationsstatus	Veröffentlicht - 24 Juli 2011
Veranstaltung	The 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials - Vancouver, Kanada Dauer: 24 Juli 2011 → 27 Juli 2011

Konferenz

Konferenz	The 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials
Land/Gebiet	Kanada
Ort	Vancouver
Zeitraum	24/07/11 → 27/07/11

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)
Experimental

Andere Dateien und Links

http://www.sfu.ca/isaf2011/

Dieses zitieren

Electron microprobe analysis of(1-x)BNT-xBKT. / Naderer, Michael; Reichmann, Klaus; Schütz, Denis et al.
2011. The 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials, Vancouver, Kanada.

Publikation: Konferenzbeitrag › (Altdaten) Vortrag oder Präsentation

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year = "2011",

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day = "24",

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note = "The 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials ; Conference date: 24-07-2011 Through 27-07-2011",

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TY - CONF

T1 - Electron microprobe analysis of(1-x)BNT-xBKT

AU - Naderer, Michael

AU - Reichmann, Klaus

AU - Schütz, Denis

AU - Mittermayr, Florian

PY - 2011/7/24

Y1 - 2011/7/24

UR - http://www.sfu.ca/isaf2011/

M3 - (Old data) Lecture or Presentation

T2 - The 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials

Y2 - 24 July 2011 through 27 July 2011

ER -