Abstract
An empirical modeling of contact nonlinearity-induced intermodulation (IM) effect on the coaxial connector is presented in this article. The IM weights on inner and outer conductors are clarified using the measurement method. The contact degeneration-induced IM evolution is quantized by considering the contact coupling effect between the inner and outer conductors. This article demonstrated a set of test methods to quantify the oxide-induced nonlinearity with contact degeneration effects, and these methods can evaluate the contact IM products and further predict the low IM lifetime of passive devices
Originalsprache | englisch |
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Aufsatznummer | 8924674 |
Seiten (von - bis) | 5091-5099 |
Seitenumfang | 9 |
Fachzeitschrift | IEEE Transactions on Instrumentation and Measurement |
Jahrgang | 69 |
Ausgabenummer | 7 |
DOIs | |
Publikationsstatus | Veröffentlicht - Juli 2020 |