Evaluation of organic sub-monolayers by X-ray based measurements under gracing incident conditions

Oliver Werzer, B. Stadlober, A. Haase, Heinz-Georg Flesch, Roland Resel

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Originalsprache	englisch
Seiten (von - bis)	20403-1-20403-5
Fachzeitschrift	The European Physical Journal - Applied Physics
Jahrgang	46
Ausgabenummer	2
DOIs	https://doi.org/10.1051/epjap/2009038
Publikationsstatus	Veröffentlicht - 2009

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title = "Evaluation of organic sub-monolayers by X-ray based measurements under gracing incident conditions",

author = "Oliver Werzer and B. Stadlober and A. Haase and Heinz-Georg Flesch and Roland Resel",

year = "2009",

doi = "http://dx.doi.org/10.1051/epjap/2009038",

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journal = "The European Physical Journal - Applied Physics",

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T1 - Evaluation of organic sub-monolayers by X-ray based measurements under gracing incident conditions

AU - Werzer, Oliver

AU - Stadlober, B.

AU - Haase, A.

AU - Flesch, Heinz-Georg

AU - Resel, Roland

PY - 2009

Y1 - 2009

U2 - http://dx.doi.org/10.1051/epjap/2009038

DO - http://dx.doi.org/10.1051/epjap/2009038

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VL - 46

SP - 20403-1-20403-5

JO - The European Physical Journal - Applied Physics

JF - The European Physical Journal - Applied Physics

IS - 2

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