Fundamental edge broadening effects during focused electron beam induced nanosynthesis

Roland Schmied; J.D. Fowlkes; Robert Winkler; P.D. Rack; Harald Plank

doi:doi:10.3762/bjnano.6.47

Fundamental edge broadening effects during focused electron beam induced nanosynthesis

Roland Schmied, J.D. Fowlkes, Robert Winkler, P.D. Rack, Harald Plank

Institut für Elektronenmikroskopie und Nanoanalytik (5190)

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Originalsprache	englisch
Seiten (von - bis)	462-471
Fachzeitschrift	Beilstein Journal of Nanotechnology
Ausgabenummer	6
DOIs	https://doi.org/doi:10.3762/bjnano.6.47
Publikationsstatus	Veröffentlicht - 2015

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Advanced Materials Science

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doi:10.3762/bjnano.6.47

Functional Nanofabrication
Dohr, J., Plank, H., Rosker, S., Winkler, R., Stermitz, M., Reisecker, V., Michelitsch, S. G. W., Brugger-Hatzl, M., Schmied, R., Eicher, B., Orthacker, A., Arnold, G., Sattelkow, J., Kolb, F., Ganner, T., Haselmann, U., Seewald, L. & Aschl, T.
1/01/09 → 31/12/23
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title = "Fundamental edge broadening effects during focused electron beam induced nanosynthesis",

author = "Roland Schmied and J.D. Fowlkes and Robert Winkler and P.D. Rack and Harald Plank",

year = "2015",

doi = "doi:10.3762/bjnano.6.47",

language = "English",

pages = "462--471",

journal = "Beilstein Journal of Nanotechnology ",

issn = "2190-4286",

publisher = "Beilstein-Institut zur F{\"o}rderung der Chemischen Wissenschaften",

number = "6",

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TY - JOUR

T1 - Fundamental edge broadening effects during focused electron beam induced nanosynthesis

AU - Schmied, Roland

AU - Fowlkes, J.D.

AU - Winkler, Robert

AU - Rack, P.D.

AU - Plank, Harald

PY - 2015

Y1 - 2015

U2 - doi:10.3762/bjnano.6.47

DO - doi:10.3762/bjnano.6.47

M3 - Article

SN - 2190-4286

SP - 462

EP - 471

JO - Beilstein Journal of Nanotechnology

JF - Beilstein Journal of Nanotechnology

IS - 6

ER -

Fundamental edge broadening effects during focused electron beam induced nanosynthesis

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Functional Nanofabrication

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