Fundamental proximity effects for electron beam induced deposition processes

Roland Schmied, Christian Gspan, Martina Dienstleder, Stefan Michelitsch, Harald Plank

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	Multinational Congress on Microscopy
Herausgeber (Verlag)	.
Seiten	517-518
Publikationsstatus	Veröffentlicht - 2011
Veranstaltung	Multinational Congress on Microscopy - Graz, Österreich Dauer: 30 Aug. 2009 → 4 Sept. 2009

Konferenz	Multinational Congress on Microscopy
Land/Gebiet	Österreich
Ort	Graz
Zeitraum	30/08/09 → 4/09/09

Fields of Expertise

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title = "Fundamental proximity effects for electron beam induced deposition processes",

author = "Roland Schmied and Christian Gspan and Martina Dienstleder and Stefan Michelitsch and Harald Plank",

year = "2011",

language = "English",

pages = "517--518",

booktitle = "Multinational Congress on Microscopy",

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note = "Multinational Congress on Microscopy ; Conference date: 30-08-2009 Through 04-09-2009",

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TY - GEN

T1 - Fundamental proximity effects for electron beam induced deposition processes

AU - Schmied, Roland

AU - Gspan, Christian

AU - Dienstleder, Martina

AU - Michelitsch, Stefan

AU - Plank, Harald

PY - 2011

Y1 - 2011

M3 - Conference paper

SP - 517

EP - 518

BT - Multinational Congress on Microscopy

PB - .

T2 - Multinational Congress on Microscopy

Y2 - 30 August 2009 through 4 September 2009

ER -