Investigation of the near fields of sputtered Au thinfilms used for SERS, using the AFM and DDA

Publikation: Konferenzbeitrag › Poster

Originalsprache	englisch
Publikationsstatus	Veröffentlicht - 2016
Veranstaltung	16th European Microscopy Conference: EMC 2016 - Lyon Convention Center, Lyon, Frankreich Dauer: 28 Aug. 2016 → 2 Sept. 2016 Konferenznummer: 16 http://www.emc2016.fr/en/

Konferenz	16th European Microscopy Conference
Kurztitel	EMC 2016
Land/Gebiet	Frankreich
Ort	Lyon
Zeitraum	28/08/16 → 2/09/16
Internetadresse	http://www.emc2016.fr/en/

ASJC Scopus subject areas

@conference{310c676f88ff4757a9d69c7e5e6d5c96,

title = "Investigation of the near fields of sputtered Au thinfilms used for SERS, using the AFM and DDA",

author = "Fitzek, {Harald Matthias} and J{\"u}rgen Sattelkow and Peter P{\"o}lt",

year = "2016",

language = "English",

note = "16th European Microscopy Conference : EMC 2016, EMC 2016 ; Conference date: 28-08-2016 Through 02-09-2016",

url = "http://www.emc2016.fr/en/",

}