Optical tracking based EM-field probing system for EMC near field manual scanning

Hui He; Pratik Maheshwari; David Pommerenke

doi:10.1109/ISEMC.2014.6899058

Optical tracking based EM-field probing system for EMC near field manual scanning

Hui He, Pratik Maheshwari, David Pommerenke

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Abstract

This paper introduces a method to visualize the frequency dependent electromagnetic field distribution on complex shaped electronic systems. This is achieved by combining magnetic field probing with an optical tracking system for automatically recording the probe position and orientation. Due to the complexity of the shape of the electronic systems of interest, and for utilizing the expertise of the user, the probe will be moved by manually instead of robotically. With the location from the optical tracking system, 3D near field strength map can be obtained at real time during near field manual scanning.

Originalsprache	englisch
Titel	2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)
Seiten	697-701
Seitenumfang	5
DOIs	https://doi.org/10.1109/ISEMC.2014.6899058
Publikationsstatus	Veröffentlicht - 15 Sept. 2014
Extern publiziert	Ja
Veranstaltung	2014 IEEE International Symposium on Electromagnetic Compatibility: EMC 2014 - Raleigh, USA / Vereinigte Staaten Dauer: 3 Aug. 2014 → 8 Aug. 2014

Konferenz

Konferenz	2014 IEEE International Symposium on Electromagnetic Compatibility
Land/Gebiet	USA / Vereinigte Staaten
Ort	Raleigh
Zeitraum	3/08/14 → 8/08/14

ASJC Scopus subject areas

Physik der kondensierten Materie
Elektrotechnik und Elektronik

Zugriff auf Dokument

10.1109/ISEMC.2014.6899058

Andere Dateien und Links

http://www.scopus.com/inward/record.url?scp=84931827772&partnerID=8YFLogxK

Dieses zitieren

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abstract = "This paper introduces a method to visualize the frequency dependent electromagnetic field distribution on complex shaped electronic systems. This is achieved by combining magnetic field probing with an optical tracking system for automatically recording the probe position and orientation. Due to the complexity of the shape of the electronic systems of interest, and for utilizing the expertise of the user, the probe will be moved by manually instead of robotically. With the location from the optical tracking system, 3D near field strength map can be obtained at real time during near field manual scanning.",

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