Organic Multylayer Photodiode: Interface Roughness and Electron Density Profile in a Stacked Device Structure

Alfred Neuhold; Stefanie Fladischer; Stefan Mitsche; Nadezda Matsko; Heinz-Georg Flesch; Armin Moser; Jiri Novak; E. Kraker; A. Haase; Werner Grogger; Roland Resel

Organic Multylayer Photodiode: Interface Roughness and Electron Density Profile in a Stacked Device Structure

Alfred Neuhold, Stefanie Fladischer, Stefan Mitsche, Nadezda Matsko, Heinz-Georg Flesch, Armin Moser, Jiri Novak, E. Kraker, A. Haase, Werner Grogger, Roland Resel

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	International Conference on Organic Electronics
Herausgeber (Verlag)	.
Seiten	237-237
Publikationsstatus	Veröffentlicht - 2010
Veranstaltung	International Conference of Organic Electronics 2010 - Paris, Frankreich Dauer: 22 Juni 2010 → 25 Juni 2010

Konferenz

Konferenz	International Conference of Organic Electronics 2010
Ort	Paris, Frankreich
Zeitraum	22/06/10 → 25/06/10

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

FWF - ISOTEC_DevAna - Nanoanalysis and Nanostructuring of organic optoelectronic Devices
Fisslthaler, E., Matsko, N., Grogger, W. & Sezen, M.
1/02/05 → 31/08/11
Projekt: Forschungsprojekt

Dieses zitieren

Neuhold, A, Fladischer, S, Mitsche, S, Matsko, N, Flesch, H-G, Moser, A, Novak, J, Kraker, E, Haase, A, Grogger, W & Resel, R 2010, Organic Multylayer Photodiode: Interface Roughness and Electron Density Profile in a Stacked Device Structure. in International Conference on Organic Electronics. ., S. 237-237, International Conference of Organic Electronics 2010, Paris, Frankreich, 22/06/10.

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title = "Organic Multylayer Photodiode: Interface Roughness and Electron Density Profile in a Stacked Device Structure",

author = "Alfred Neuhold and Stefanie Fladischer and Stefan Mitsche and Nadezda Matsko and Heinz-Georg Flesch and Armin Moser and Jiri Novak and E. Kraker and A. Haase and Werner Grogger and Roland Resel",

year = "2010",

language = "English",

pages = "237--237",

booktitle = "International Conference on Organic Electronics",

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note = "International Conference of Organic Electronics 2010 ; Conference date: 22-06-2010 Through 25-06-2010",

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TY - GEN

T1 - Organic Multylayer Photodiode: Interface Roughness and Electron Density Profile in a Stacked Device Structure

AU - Neuhold, Alfred

AU - Fladischer, Stefanie

AU - Mitsche, Stefan

AU - Matsko, Nadezda

AU - Flesch, Heinz-Georg

AU - Moser, Armin

AU - Novak, Jiri

AU - Kraker, E.

AU - Haase, A.

AU - Grogger, Werner

AU - Resel, Roland

PY - 2010

Y1 - 2010

M3 - Conference paper

SP - 237

EP - 237

BT - International Conference on Organic Electronics

PB - .

T2 - International Conference of Organic Electronics 2010

Y2 - 22 June 2010 through 25 June 2010

ER -

Organic Multylayer Photodiode: Interface Roughness and Electron Density Profile in a Stacked Device Structure

Konferenz

Treatment code (Nähere Zuordnung)

Projekte

FWF - ISOTEC_DevAna - Nanoanalysis and Nanostructuring of organic optoelectronic Devices

Dieses zitieren