Oxygen surface exchange kinetics and electronic conductivity of the third-order Ruddlesden-Popper phase Pr₄Ni_2.7Co_0.3O_10-δ

Ingenieurwesen & Materialwissenschaft

• Oxygen 100%
• Partial pressure 73%
• Thin films 58%
• Rietveld analysis 58%
• Optical emission spectroscopy 51%
• Scanning electron microscopy 48%
• Pulsed laser deposition 47%
• Inductively coupled plasma 46%
• Yttria stabilized zirconia 41%
• Microelectrodes 41%
• Phase structure 40%
• Crystal structure 39%
• X ray diffraction analysis 38%
• Photolithography 38%
• Electrochemical impedance spectroscopy 38%
• Spectroscopy 34%
• Transmission electron microscopy 31%
• X ray diffraction 30%
• Drying 29%
• Sintering 29%
• Capacitance 26%
• Temperature 24%
• Electrodes 23%
• Acoustic impedance 22%
• Substrates 21%

Physik & Astronomy

• conductivity 81%
• oxygen 74%
• kinetics 74%
• electronics 64%
• partial pressure 59%
• impedance 47%
• freeze drying 44%
• scanning electron microscopy 40%
• optical emission spectroscopy 35%
• photolithography 34%
• coefficients 33%
• yttria-stabilized zirconia 33%
• diffraction 33%
• spectroscopy 32%
• thin films 31%
• pulsed laser deposition 29%
• x rays 27%
• purity 26%
• capacitance 24%
• crystal structure 24%
• sintering 23%
• transmission electron microscopy 20%
• electrodes 19%
• temperature 18%

Chemie

• Conductivity 82%
• Dioxygen 60%
• Partial Pressure 59%
• Impedance Spectroscopy 47%
• Pulsed Laser Deposition 40%
• Surface 39%
• Optical Emission Spectroscopy 38%
• Scanning Transmission Electron Microscopy 35%
• Freeze Drying 33%
• Rietveld Refinement 30%
• Inductively Coupled Plasma 30%
• X-Ray Diffraction 30%
• Sintering 25%
• Resistance 19%
• Scanning Electron Microscopy 18%
• Purity 15%
• Behavior as Electrode 15%
• Crystal Structure 15%