Abstract
In space-borne, medical and high energy physics applications, the heart of a measurement system is usually an Integrated Circuit (IC). More and more often Application-Specific Integrated Circuits (ASICs) are used instead of from-the-shelve products: ASIC offers lower power consumption than a standard IC or a discrete solution; also, higher measurement precision can be achieved, thanks to small capacitances and high speed, combined with a customized architecture.
This talk focuses on Total Ionizing Dose (TID) effects on integrated circuits (IC) and prospects for their mitigation through Radiation-Hard-by-Design (RHBD) techniques. It also discusses the radiation-hardened ASIC design flow, in particular emphasizing the issues of efficient irradiation tests and characterization of the integrated test structures.
This talk focuses on Total Ionizing Dose (TID) effects on integrated circuits (IC) and prospects for their mitigation through Radiation-Hard-by-Design (RHBD) techniques. It also discusses the radiation-hardened ASIC design flow, in particular emphasizing the issues of efficient irradiation tests and characterization of the integrated test structures.
Originalsprache | englisch |
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Publikationsstatus | Veröffentlicht - 2016 |
Veranstaltung | Inauguration and Radhard Symposium - Seibersdorf Laboratories, Seibersdorf, Österreich Dauer: 7 Juni 2016 → 8 Juni 2016 |
Konferenz
Konferenz | Inauguration and Radhard Symposium |
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Land/Gebiet | Österreich |
Ort | Seibersdorf |
Zeitraum | 7/06/16 → 8/06/16 |
Fields of Expertise
- Information, Communication & Computing