TY - JOUR
T1 - Reconstruction of dispersive dielectric properties for PCB substrates using a genetic algorithm
AU - Zhang, Jianmin
AU - Koledintseva, Marina Y.
AU - Drewniak, James L.
AU - Pommerenke, David J.
AU - DuBroff, Richard E.
AU - Yang, Zhiping
AU - Cheng, Wheling
AU - Rozanov, Konstantin N.
AU - Antonini, Giulio
AU - Orlandi, Antonio
PY - 2008/9/10
Y1 - 2008/9/10
N2 - An effective method for extracting parameters of a Debye or a Lorentzian dispersive medium over a wideband frequency range using a genetic algorithm (GA) and a transmission-line model is presented. Scattering parameters (S-parameters) of the transmission-line sections, including a parallel plate, microstrip, and stripline, are measured. Wave equations for TEM/quasi-TEM mode with a complex propagation constant and a frequency-dependent wave impedance are used to evaluate the corresponding S-parameters in an analytical model. The discrepancy between the modeled and measured S-parameters is defined as the objective function in the GA. The GA is used for search of the dispersive-medium parameters by means of minimizing the objective function over the entire frequency range of interest. The reconstructed Debye or Lorentzian dispersive material parameters are corroborated by comparing the original measurements with the FDTD modeling results. The self-consistency of the proposed method is demonstrated by constructing different test structures with an identical material, i.e., material parameters of a substrate extracted from different transmission-line configurations. The port effects on the material parameter extraction are examined by using through-reflection-line calibration.
AB - An effective method for extracting parameters of a Debye or a Lorentzian dispersive medium over a wideband frequency range using a genetic algorithm (GA) and a transmission-line model is presented. Scattering parameters (S-parameters) of the transmission-line sections, including a parallel plate, microstrip, and stripline, are measured. Wave equations for TEM/quasi-TEM mode with a complex propagation constant and a frequency-dependent wave impedance are used to evaluate the corresponding S-parameters in an analytical model. The discrepancy between the modeled and measured S-parameters is defined as the objective function in the GA. The GA is used for search of the dispersive-medium parameters by means of minimizing the objective function over the entire frequency range of interest. The reconstructed Debye or Lorentzian dispersive material parameters are corroborated by comparing the original measurements with the FDTD modeling results. The self-consistency of the proposed method is demonstrated by constructing different test structures with an identical material, i.e., material parameters of a substrate extracted from different transmission-line configurations. The port effects on the material parameter extraction are examined by using through-reflection-line calibration.
KW - Electromagnetic propagation in dispersive media
KW - Finite-difference time-domain (FDTD) methods
KW - Genetic algorithms (GAs)
KW - Scattering parameters
KW - Transmission lines
UR - http://www.scopus.com/inward/record.url?scp=51049083829&partnerID=8YFLogxK
U2 - 10.1109/TEMC.2008.927923
DO - 10.1109/TEMC.2008.927923
M3 - Article
AN - SCOPUS:51049083829
SN - 0018-9375
VL - 50
SP - 704
EP - 714
JO - IEEE Transactions on Electromagnetic Compatibility
JF - IEEE Transactions on Electromagnetic Compatibility
IS - 3 PART 2
ER -