The use of maximum entropy and bayesian techniques in nuclear microprobe applications

V. M. Prozesky; J. Padayachee; R. Fischer; W. Von Der Linden; V. Dose; C. G. Ryan

doi:10.1063/1.52523

The use of maximum entropy and bayesian techniques in nuclear microprobe applications

V. M. Prozesky, J. Padayachee, R. Fischer, W. Von Der Linden, V. Dose, C. G. Ryan

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband

Abstract

An introduction to the use of maximum entropy (ME) and Bayesian methods in ion-beam applications is presented. The formalism is applied to the deconvolution of detector blurring functions in RBS and PIXE measurements. The resulting improvement in detector resolution can be as much as a factor of 5 when the detector functions are well known. The possibilities of further applications in ion-beam related work are also discussed.

Originalsprache	englisch
Titel	5th International Conference (Santa Fe, New Mexico),on Nuclear Microprobe Technology and Applications
Erscheinungsort	Santa Fe
Herausgeber (Verlag)	North-Holland Publ Co
Seiten	595-598
Seitenumfang	4
Band	392
DOIs	https://doi.org/10.1063/1.52523
Publikationsstatus	Veröffentlicht - 1996
Extern publiziert	Ja

Zugriff auf Dokument

10.1063/1.52523

http://aip.scitation.org/doi/abs/10.1063/1.52523

Dieses zitieren

The use of maximum entropy and bayesian techniques in nuclear microprobe applications. / Prozesky, V. M.; Padayachee, J.; Fischer, R. et al.
5th International Conference (Santa Fe, New Mexico),on Nuclear Microprobe Technology and Applications. Band 392 Santa Fe: North-Holland Publ Co, 1996. S. 595-598.

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband

@inproceedings{0866b6796c6d4fc38563a889eb1fe3c6,

title = "The use of maximum entropy and bayesian techniques in nuclear microprobe applications",

abstract = "An introduction to the use of maximum entropy (ME) and Bayesian methods in ion-beam applications is presented. The formalism is applied to the deconvolution of detector blurring functions in RBS and PIXE measurements. The resulting improvement in detector resolution can be as much as a factor of 5 when the detector functions are well known. The possibilities of further applications in ion-beam related work are also discussed.",

author = "Prozesky, {V. M.} and J. Padayachee and R. Fischer and {Von Der Linden}, W. and V. Dose and Ryan, {C. G.}",

year = "1996",

doi = "10.1063/1.52523",

language = "English",

volume = "392",

pages = "595--598",

booktitle = "5th International Conference (Santa Fe, New Mexico),on Nuclear Microprobe Technology and Applications",

publisher = "North-Holland Publ Co",

address = "Netherlands",

}

TY - GEN

T1 - The use of maximum entropy and bayesian techniques in nuclear microprobe applications

AU - Prozesky, V. M.

AU - Padayachee, J.

AU - Fischer, R.

AU - Von Der Linden, W.

AU - Dose, V.

AU - Ryan, C. G.

PY - 1996

Y1 - 1996

N2 - An introduction to the use of maximum entropy (ME) and Bayesian methods in ion-beam applications is presented. The formalism is applied to the deconvolution of detector blurring functions in RBS and PIXE measurements. The resulting improvement in detector resolution can be as much as a factor of 5 when the detector functions are well known. The possibilities of further applications in ion-beam related work are also discussed.

AB - An introduction to the use of maximum entropy (ME) and Bayesian methods in ion-beam applications is presented. The formalism is applied to the deconvolution of detector blurring functions in RBS and PIXE measurements. The resulting improvement in detector resolution can be as much as a factor of 5 when the detector functions are well known. The possibilities of further applications in ion-beam related work are also discussed.

U2 - 10.1063/1.52523

DO - 10.1063/1.52523

M3 - Conference paper

VL - 392

SP - 595

EP - 598

BT - 5th International Conference (Santa Fe, New Mexico),on Nuclear Microprobe Technology and Applications

PB - North-Holland Publ Co

CY - Santa Fe

ER -

The use of maximum entropy and bayesian techniques in nuclear microprobe applications

Abstract

Zugriff auf Dokument

Fingerprint

Dieses zitieren