Abstract
The volume plasmon excitation of valence electrons within soft organic matter contains a variety of characteristics responsible for their intrinsic physical and chemical properties. Up to now, the analysis of those properties (hardness, surface related signal) within Transmission Electron Microscopy (TEM) remains problematic due to the lack of methodological approaches which enable the extraction of required information from the ATEM data. Here we propose an empiric EFTEM based method that allows one to identify the latter.
| Originalsprache | englisch |
|---|---|
| Seiten (von - bis) | 2-4 |
| Fachzeitschrift | Imaging & Microscopy |
| Jahrgang | 16 |
| Publikationsstatus | Veröffentlicht - 2014 |
ASJC Scopus subject areas
- Allgemeine Materialwissenschaften
Fields of Expertise
- Advanced Materials Science
Treatment code (Nähere Zuordnung)
- Basic - Fundamental (Grundlagenforschung)