Fields of Expertise
- Advanced Materials Science
Direct measurements of contact resistance in MoS2-based thin film transistors via Kelvin probe force microscopy
- Aleksandar Matkovic (Speaker)
- Andreas Petritz (Contributor)
- Gerburg Schider (Contributor)
- Markus Krammer (Contributor)
- Markus Kratzer (Contributor)
- Esther Karner-Petritz (Contributor)
- Alexander Fian (Contributor)
- Herbert Gold (Contributor)
- Michael Gärtner (Contributor)
- Andreas Terfort (Contributor)
- Christian Teichert (Contributor)
- Zojer, E. (Contributor)
- Zojer, K. (Contributor)
- Barbara Stadlober (Contributor)
Activity: Talk or presentation › Talk at conference or symposium › Science to science