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Focused Ion Beam Processing of Soft Matter: from Fundamental Effects towards TEM Lamella Preparation
Plank, H.
(Speaker)
Institute of Electron Microscopy and Nanoanalysis (5190)
Activity
:
Talk or presentation
›
Invited talk at conference or symposium
›
Science to science
Period
25 Jun 2013
→
26 Jun 2013
Event title
D-A-CH FIB-Workshop
Event type
Conference
Location
Unterpremstätten, Austria
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Keywords
Nanofabrication
Focused Ion Beam Processing
Soft Matter