Project Details
Description
Development of new electron microscopical investigation techniques for the characterization of nanostructured materials; eg. electron tomography and EELS near edge structure analysis
Status | Finished |
---|---|
Effective start/end date | 1/10/98 → 31/05/00 |
Fingerprint
Explore the research topics touched on by this project. These labels are generated based on the underlying awards/grants. Together they form a unique fingerprint.